A Comparison of Uncertainty Evaluation Methods for On-Wafer $S$-Parameter Measurements
نویسندگان
چکیده
An experimental analysis of on-wafer S-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution have been introduced. In order estabilish their suitability, a careful comparison is here given for on-wafer meaurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is here presented for the first time.
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عنوان ژورنال:
- IEEE Trans. Instrumentation and Measurement
دوره 63 شماره
صفحات -
تاریخ انتشار 2014